Aspex Explorer SEM / EDS

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			Manufacturer	Aspex
			Model	Explorer
			Instrument Type	SEM / EDS
			Description	A focused beam of electrons to produces a high resolution image of a sample in the range of a few nanometers, as well as other signals containing topographical and compositional information.
			Key Features	2-25 kV e-beam, equipped with a secondary electron detector, quad back scatter electron detectors, x-ray detector, variable pressure mode allows imaging of some insulating samples.
			Material Restrictions	Clean, dry, low-outgassing substrates, must be stable under mechanical vacuum, no magnetic samples, sputter coating of insulating samples may be necessary.