Manufacturer

Leica

Model

Stereoscan S430

Instrument Type

Scanning Electron Microscope

Description

A focused beam of electrons to produces a high resolution image of a sample in the range of a few nanometers, as well as other signals containing topographical and compositional information.

Key Features

0.3-30 kV e-beam energy, equipped with a secondary electron detector and back scatter electron detectors.

Material Restrictions

Clean, dry, low-outgassing substrates, must be stable under mechanical vacuum, no magnetic samples, sputter coating of insulating samples may be necessary.