Manufacturer

Tencor

Model

Alpha Step 200

Instrument Type

Profilometer

Description

Measures thick/thin film and material surface profiles by scanning across the sample with a stylus in contact with the surface for a set distance in order to quantify its roughness.

Key Features

12.5 ╬╝m radius stylus, Scan length of 80, 400, 2,000 or 10,000 ╬╝m, scan time of 8 or 40 sec, features an internal printer for summary of data and plot of profile.

Material Restrictions

Sample size must be less than 16.5mm thick and 162 mm diameter.