Aspex EXplorer SEM / EDS




A scanning electron microscope (SEM) is a high power microscope which utilizes a column of electrons to image a sample.

Secondary and back-scattered electrons ejected by the sample are collected by a detector to form an image.

Many SEM's are also able to determine the composition of a sample using an x-ray detector (EDS).


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Manufacturer: Aspex

Model: EXplorer

Instrument Type: SEM / EDS

Description: A focused beam of electrons to produces a high resolution image of a sample in the range of a few nanometers, as well as other signals containing topographical and compositional information.

Key Features: 2-25 kV e-beam, equipped with a secondary electron detector, quad back scatter electron detectors, x-ray detector, variable pressure mode allows imaging of some insulating samples.

Material Restrictions: Clean, dry, low-outgassing substrates, must be stable under mechanical vacuum, sputter coating of insulating samples may be necessary.

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